Ordinary and extraordinary refractive indices for AlxGa1−xN epitaxial layers

摘要: Dispersion of the ordinary and extraordinary indices refraction for wurtzite AlxGa1−xN epitaxial layers with x=0.00, 0.04, 0.08, 0.11, 0.20 in range wavelengths 457<λ<980 nm were measured via a prism-coupled waveguide technique. The quantitative accuracy x is ±10% refractive ∼±0.01. dispersion found to be well described by 1st-order Sellmeier formula. A simple functional form presented that allows calculation as functions λ.