作者: Virendra Singh , Beer Pal Singh , T.P Sharma , R.C Tyagi
DOI: 10.1016/S0925-3467(02)00043-5
关键词: Chemical vapor deposition 、 Optics 、 Thin film 、 Refractive index 、 Analytical chemistry 、 Vacuum chamber 、 Absorption spectroscopy 、 Crystallinity 、 Thermal decomposition 、 Chemistry 、 Evaporation (deposition)
摘要: Abstract The optical constants ( n , k ) of evaporated cadmium sulphide (CdS) thin films deposited in an ambient atmosphere hydrogen (H 2 S) were determined over the wavelength range 350–800 nm from measurement reflection and transmission spectra. Low H S was obtained by thermal decomposition thiourea inside vacuum chamber. Cadmium with are more uniform, adherent, pin hole free have better crystallinity comparison without as inferred sharpness absorption Such inherently suited for device fabrication.