作者: Ratan Debnath , Jong-Yoon Ha , Baomei Wen , Dipak Paramanik , Abhishek Motayed
DOI: 10.1116/1.4865908
关键词: Wide-bandgap semiconductor 、 Materials science 、 Etching (microfabrication) 、 Inductively coupled plasma 、 Nanopillar 、 Analytical chemistry 、 Reactive-ion etching 、 Plasma etching 、 Gallium nitride 、 Optoelectronics 、 Nitride
摘要: Large-area gallium nitride (GaN) micro- and nanopillar (NP) arrays were fabricated by plasma etching of lithographically patterned GaN thin-film grown on Si substrate. Deep-ultraviolet lithography, inductively coupled (ICP) etching, subsequent chemical treatments effectively utilized to fabricate pillars with diameters ranging from 250 nm 10 μm. The impact various process parameters etchants the morphology, strain, surface defects these NPs studied using scanning-electron microscopy, photoluminescence (PL), Raman spectroscopy. It was found that shape can be controlled substrate temperature during etch different gas chemistries. Room-temperature PL spectroscopy measurements revealed significant strain relaxation in diameter as compared 10 μm pillars. measurement also indicated damage removed KOH-ethylene glycol solution. Post-ICP selective wet enabled us functional structures such nanodisks GaN, which potentially could nitride-based resonators lasers.