作者: Matin Amani , Matthew L. Chin , Alexander L. Mazzoni , Robert A. Burke , Sina Najmaei
DOI: 10.1063/1.4873680
关键词: Electron mobility 、 Nanotechnology 、 Molybdenum disulfide 、 Materials science 、 Graphene 、 Chemical vapor deposition 、 Chemical engineering 、 Substrate (electronics) 、 Thin-film transistor 、 Electrical measurements 、 Monolayer
摘要: We report on the electronic transport properties of single-layer thick chemical vapor deposition (CVD) grown molybdenum disulfide (MoS 2 ) field-effect transistors (FETs) on Si/SiO 2 …