Deformation instabilities in a thin plastic film on an elastic substrate due to strain mismatch
作者： Jean-Claude Ramirez
DOI: 10.1016/0020-7683(89)90026-7
关键词: Materials science 、 Plastic film 、 Linear elasticity 、 Instability 、 Bifurcation 、 Composite material 、 Deformation (engineering) 、 Substrate (electronics) 、 Thin film 、 Stress (mechanics) 、 Optics
摘要: Abstract A model is constructed of a thin film rigid-plastic material bonded to linear elastic substrate subject state mismatch strain between the two materials. The purpose study investigate existence deformation localization in that periodic along direction bi-material interface. Bifurcation phenomena could be possible precursor debonding phenomena. conditions necessary for these undulations appear are given by bifurcation equation which relates internal stress relative stiffness and thickness film.
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sci-hub.se 参考文章(11)
Yuan-Cheng Fung, Foundations of solid mechanics ,(1965)
Y. Hu, L. B. Freund, Shear stress at a film-substrate interface due to mismatch strain Unknow. ,(1988)
D. Nir, Stress relief forms of diamond-like carbon thin films under internal compressive stress Thin Solid Films. ,vol. 112, pp. 41- 50 ,(1984) , 10.1016/0040-6090(84)90500-5
C. Weissmantel, G. Reisse, H.-J. Erler, F. Henny, K. Bewilogua, U. Ebersbach, C. Schürer, Preparation of hard coatings by ion beam methods Thin Solid Films. ,vol. 63, pp. 315- 325 ,(1979) , 10.1016/0040-6090(79)90035-X
M.S. Jackson, Li Che-yu, Stress relaxation and hillock growth in thin films Acta Metallurgica. ,vol. 30, pp. 1993- 2000 ,(1982) , 10.1016/0001-6160(82)90103-1
E. P. EerNisse, Stress in ion‐implanted CVD Si3N4 films Journal of Applied Physics. ,vol. 48, pp. 3337- 3341 ,(1977) , 10.1063/1.324217
R. Hill, J.W. Hutchinson, Bifurcation phenomena in the plane tension test Journal of the Mechanics and Physics of Solids. ,vol. 23, pp. 239- 264 ,(1975) , 10.1016/0022-5096(75)90027-7
J.-C. Ramirez, P.J. McNally, L.S. Cooper, J.J. Rosenberg, L.B. Freund, T.N. Jackson, Development and experimental verification of a two-dimensional numerical model of piezoelectrically induced threshold voltage shifts in GaAs MESFETs IEEE Transactions on Electron Devices. ,vol. 35, pp. 1232- 1240 ,(1988) , 10.1109/16.2542
Paul S. Steif, Bimaterial interface instabilities in plastic solids International Journal of Solids and Structures. ,vol. 22, pp. 195- 207 ,(1986) , 10.1016/0020-7683(86)90007-7
Maurice Anthony Biot, DC Drucker, Mechanics of Incremental Deformation Journal of Applied Mechanics. ,vol. 32, pp. 957- 958 ,(1965) , 10.1115/1.3627365