Photoluminescence of nitrogen (N)‐implanted and N‐free In0.30Ga0.70P grown by liquid phase epitaxy

作者: Akira Fujimoto , Yunosuke Makita , Hidetoshi Nojiri , Toshihiko Kanayama , Toshio Tsurushima

DOI: 10.1063/1.328184

关键词: NitrogenAnalytical chemistryPl spectraEpitaxyLiquid phaseExcitonMaterials scienceBinding energyAnnealing (metallurgy)PhotoluminescenceInorganic chemistry

摘要: Photoluminescence (PL) studies were performed at 2 K for nitrogen (N)‐implanted and N‐free In0.30Ga0.70P crystals, which grown by a step‐cooling liquid‐phase‐epitaxial method. For the N‐implanted In0.30Ga0.70P, an isoelectronic trap was found to be formed annealing temperature over 600 °C. The binding energy of excitons bound above traps determined 92 meV from dependence PL spectra.

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