Extraction and modeling of self-heating and mutual thermal coupling impedance of bipolar transistors
作者： N. Nenadovic , S. Mijalkovic , L.K. Nanver , L.K.J. Vandamme , V. d'Alessandro
关键词: Electronic circuit 、 Impedance matching 、 Function generator 、 Spectrum analyzer 、 Thermal resistance 、 Electrical impedance 、 Amplifier 、 Bipolar junction transistor 、 Optoelectronics 、 Materials science
摘要: A measurement system comprised of an ultra-low-distortion function generator, lock-in amplifier, and semiconductor parameter analyzer is used for sensitive extraction the small-signal thermal impedance network bipolar devices circuits. The procedure demonstrated through measurements on several silicon-on-glass NPN test structures. Behavioral modeling mutual coupling obtained by fitting a multipole rational complex to measured data presented.
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