Picosecond free-electron laser studies of Auger recombination in arsenic-rich InAs1–xSbx strained layer superlattices at 300 K

作者: C.M. Ciesla , M.J. Pullin , I. Galbraith , R.A. Stradling , C.J.G.M. Langerak

DOI: 10.1049/IP-OPT:19971593

关键词: Auger effectElectronic band structureBand gapExcited statePicosecondAnalytical chemistryMaterials scienceAugerMolecular physicsSuperlatticeExcitation

摘要: Room temperature pump-probe transmission experiments have been performed on arsenic-rich InAs/InAs/sub 1-x/Sb/sub x/ strained layer superlattices (SLS) using a picosecond far-infrared free electron laser. With excitation frequencies well above the fundamental bandgap, near 10 /spl mu/m, large excited carrier concentrations were obtained, allowing density dependence of recombination rate to be determined directly. The results interpreted in terms an 8/spl times/8 (k.p) SLS energy band calculation, including full dispersion for both k in-plane and parallel growth direction. A comparison with identical measurements epilayers InSb, comparable room shows that Auger processes substantially suppressed superlattices, In non-degenerate regime, where lifetime scales as tau//sub aug//sup -1/=C/sub 1/N/sub e//sup 2/ value C/sub 1/ between 100 times smaller is obtained structures.

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