作者: S. Kalbitzer , G. Müller , P. G. Le Comber , W. E. Spear
DOI: 10.1080/13642818008245398
关键词: Amorphous silicon 、 Ion implantation 、 Photoconductivity 、 Range (particle radiation) 、 Ion 、 Doping 、 Analytical chemistry 、 Materials science 、 Halogen 、 Impurity
摘要: Abstract In this paper we present the results of a systematic study ion implantation doping in glow-discharge a-Si films using substitutional impurities, P, As, Sb, Bi, B, Al, Ga, and Tl interstitial impurities Na, K, Rb Cs. Implantation provides same range control electrical properties as gas phase doping, but at lower efficiency. The compensation pre-doped specimens by has been investigated found to be feasible predictable. As an example characteristics implanted p-n junction are shown. Results with F, Cl, Br I implantations indicate that halogens do not act acceptors. effect damage on its dependence temperature have some detail. Photoconductivity measurements provide useful approach problem it is concluded density gap states increases dose, even for hot implantations. A ...