作者: Hiroki Okudera , Atsushi Hozumi
DOI: 10.1016/S0040-6090(03)00535-2
关键词: Crystallography 、 Adhesion 、 Microstructure 、 Colloid 、 Diffusion 、 Chemical engineering 、 Stöber process 、 Surface finish 、 Substrate (electronics) 、 Chemistry 、 Thin film
摘要: Abstract Silica nanoparticles and thin film on flat substrate were simultaneously prepared by the Stober method. The growth kinetics of these precipitates fine structure surface investigated atomic force microscopy. formed a hydrophilic was uniform, with root-mean-square (RMS) roughness ≈1 nm. observed to be slower than that particles, indicating silica limited diffusion reactive species. On other hand, hydrophobic not flat, RMS ≈10 nm, characterized convex microstructures two distinct sizes its surface. appearance delay in formation indicate precipitates, including spherical colloids, as aggregations primary particles appearing precursor solution, then grew adhesion forming continuously solution.