作者: W.C. Turkenburg , W. Soszka , F.W. Saris , H.H. Kersten , B.G. Colenbrander
DOI: 10.1016/0029-554X(76)90798-9
关键词: Surface (mathematics) 、 Medium energy 、 Surface reconstruction 、 Single crystal 、 Optics 、 Relaxation (physics) 、 Ion 、 Materials science 、 Molecular physics 、 Surface structure 、 Rutherford scattering
摘要: Abstract The use of Rutherford backscattering for structural analysis single crystal surfaces is reviewed, and a new method introduced. With this method, which makes the channeling blocking phenomenon light ions medium energy, surface atoms can be located with precision 0.02 A. This demonstrated in measurement relaxation Cu(110) surface.