Multilayered probe card
作者： Igor Y. Khandros , Gaetan L. Mathieu , Chih-Chiang Tseng , Gary W. Grube , Poya Lotfizadeh
DOI:
关键词: Probe card 、 Computer hardware 、 Design data 、 Engineering drawing 、 Engineering
摘要: A method of designing and manufacturing a probe card assembly includes prefabricating one or more elements the to predefined designs. Thereafter, design data regarding newly designed semiconductor device is received along with describing tester testing algorithms be used test device. Using data, prefabricated selected. Again using selected customized. The then built customized elements.
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