Circuit-test probe card and probe substrate structure thereof
作者： Ching-Dong Wang
DOI:
关键词: Probe card 、 Nanotechnology 、 Substrate (printing) 、 Materials science 、 Optoelectronics 、 Printed circuit board 、 Test probe
摘要: A circuit-test probe card and a substrate structure thereof are disclosed herein to effectively narrow down the pitch of testing points card. The utilizes top bottom surfaces respectively electrically connect with circuit board plurality probes. includes main body having upper contacts arranged on an surface thereof; wires penetrating body. Two ends each wire exposed lower is larger than surface. connected contacts.
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