作者: R. F. Mathis , B. R. Turner , J. A. Rutherford
DOI: 10.1063/1.1670366
关键词: Attenuation 、 Ion beam 、 Ion beam deposition 、 Beam (structure) 、 Chemistry 、 Ion 、 Excited state 、 Electron 、 Atomic physics 、 Ion source 、 Physical and Theoretical Chemistry 、 General Physics and Astronomy
摘要: A study of a beam NO+ ions has been undertaken to determine the relative abundances excited‐state and ground‐state ions. The experimental procedure involved attenuation ion in gas‐filled reaction chamber where different states were attenuated at rates. produced from NO by impact electrons with energies 25, 50, 100 eV. determined ∼20 μsec after formed, so that only long‐lived remained beam. Several gases, H2, N2, O2, H2O, Ar, employed assess importance de‐excitation processes reduce possibility identical‐loss cross sections for excited ground states. It was found high pressures source, as well electron energy, could influence abundance typical result that, using 50‐eV low source pressures, 42% excited.