Fault diagnosis in designs with convolutional compactors
作者： G. Mrugalski , A. Pogiel , J. Rajski , J. Tyszer , Chen Wang
DOI: 10.1109/TEST.2004.1386986
关键词: Computer engineering 、 Real-time computing 、 Scan chain 、 Fault coverage 、 Automatic test pattern generation 、 Stuck-at fault 、 Fault (power engineering) 、 Engineering 、 Boundary scan 、 Identification (information) 、 Built-in self-test
摘要: The paper introduces a new non-adaptive fault diagnosis technique for scan-based designs. proposed scheme guarantees accurate and time-efficient identification of failing scan cells based on results convolutional test response compaction.
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