Performance comparison of SiC Schottky diodes and silicon ultra fast recovery diodes

作者: Marek Adamowicz , Sebastian Giziewski , Jedrzej Pietryka , Zbigniew Krzeminski

DOI: 10.1109/CPE.2011.5942222

关键词: Power electronicsGate driverOptoelectronicsDiodePower semiconductor deviceMaterials scienceSilicon carbideSchottky diodep–n junctionElectronic circuit

摘要: … voltage spike due to snappy recovery [3]. The snap-off in the Si Ultrafast diode causes oscillations in … Excessive voltage spikes during turn-off process even can destroy the diode. These …

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