作者: Xiaoyan Fu , Hiroshi Yamada , Keiko Nishikubo , Hongwu Zhang , Chao-Nan Xu
DOI: 10.1016/J.JCRYSGRO.2008.01.046
关键词: Transmission electron microscopy 、 Composite material 、 Crystallinity 、 Thin film 、 Pole figure 、 Transmittance 、 Physical vapor deposition 、 Substrate (electronics) 、 Layer (electronics) 、 Materials science 、 Optics 、 Inorganic chemistry 、 Materials Chemistry 、 Condensed matter physics
摘要: Abstract This paper describes the preparation and characterization of fiber-textured SrAl2O4:Eu films on a quartz glass substrate using homo-buffer layer. The effect buffer layer crystallinity adhesion was investigated by cross-section transmission electron microscopy X-ray diffraction (XRD). results show that prepared film not only well crystallized but also highly textured. preferred orientation this textured confirmed to be (0 3 1) pole figure measurement. In addition, exhibits excellent optical transparency, with an average transmittance more than 80% in visible range.