作者: Konstantin Likharev
DOI: 10.1038/35069173
关键词: Nanotechnology 、 Silicon 、 Nanoscopic scale 、 Charge (physics) 、 Electron 、 Electric current 、 Materials science
摘要: Controlled transfer of single electrons in nanoscale devices allows electric current to be measured fundamental units charge and frequency. A new silicon device promises make these standards more practical.