作者: Hiroshi Fujita
DOI: 10.2320/MATERTRANS1989.31.523
关键词: Materials science 、 Electron beam-induced deposition 、 Conventional transmission electron microscope 、 Energy filtered transmission electron microscopy 、 Electron tomography 、 Nanotechnology 、 Scanning confocal electron microscopy 、 Scanning transmission electron microscopy 、 Reflection high-energy electron diffraction 、 Optics 、 High-resolution transmission electron microscopy
摘要: