作者: Hiroshi Fujita
DOI: 10.1080/10420159208219823
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摘要: Abstract Electron microscopy has greatly contributed as a powerful tool in both the characterization and identification of materials atomic scale. In these contributions, most important advantage is it's ability for dynamic study phenomena, i.e., situ experiments. This research been carried out using high voltage electron microscopes, but some results have obtained with resolution microscopes under critical conditions. improved further to become an indispensable “Micro-Laboratory” which formation various advance can also be precisely beam science engineering typical example this field, detailed processes crystalline-amorphous transition irradiation induced foreign atom implantation clarified by method. Recently, new applications fields non-linear material behavior, such behavior clusters ...