Ultra-high Voltage Electron Microscopy and Its Applications to New Research Fields in Materials Science

摘要: The electron channeling, whose rate is proportional to the relativistic mass of an electron, occurs at high accelerating voltages by interaction among many simultaneously excited waves. As a result, maximum observable specimen thickness markedly increases with increasing voltage, so that essentially same behavior lattice defects in almost all materials can be observed dynamically as bulk specimens ultra-high voltage microscope (UHVEM). In situ experiments UHVEM have been carried out research fields natural science, particularly science. present article, these experiments, only formation process non-equilibrium phases and its related phenomena are mentioned one topics beam science engineering which has developed recently UHVEM.