Effects of solvents and carrier gases on the electrical and optical properties of pyrosol-deposited SnO2-based films

作者: K.H. Yoon , J.S. Song

DOI: 10.1016/0040-6090(93)90433-P

关键词: DiffractionMineralogyDeposition (law)Resistive touchscreenMorphology (linguistics)Chemical compositionAnalytical chemistryOxidizing agentSolventElectrical resistivity and conductivityChemistry

摘要: Abstract SnO 2 -based films have been prepared by the pyrosol deposition method, and dependence of their electrical optical properties on solvent (CH 3 OH, H O) concentration in solution nature carrier gas (air, N ) has investigated. The resistivity obtained using air as decreases CH OH:H O mole ratio increases to 2–3, then with further increase ratio. transmittance exhibits a gradual decrease use always leads production much more resistive less transparent owing lower Hall mobility, but sharply increasing variations mobility function seem be good agreement changes surface morphology, which turn are well reflected X-ray diffraction analysis. These two experimental parameters governing total amount oxidizing agents included solutions appear also affect chemical composition films, influences not significant enough explain all properties.

参考文章(13)
R. N. Ghoshtagore, Mechanism of CVD Thin Film SnO2 Formation Journal of The Electrochemical Society. ,vol. 125, pp. 110- 117 ,(1978) , 10.1149/1.2131373
Chitra Agashe, M.G. Takwale, B.R. Marathe, V.G. Bhide, Structural properties of SnO2: F films deposited by spray pyrolysis Solar Energy Materials. ,vol. 17, pp. 99- 117 ,(1988) , 10.1016/0165-1633(88)90010-X
E. Shanthi, A. Banerjee, V. Dutta, K. L. Chopra, Electrical and optical properties of tin oxide films doped with F and (Sb+F) Journal of Applied Physics. ,vol. 53, pp. 1615- 1621 ,(1982) , 10.1063/1.330619
M. Fantini, I. Torriani, The Compositional And Structural Properties Of Sprayed Sno2:f Thin Films web science. ,vol. 138, pp. 255- 265 ,(1986) , 10.1016/0040-6090(86)90398-6
A. L. Dawar, J. C. Joshi, Semiconducting transparent thin films: their properties and applications Journal of Materials Science. ,vol. 19, pp. 1- 23 ,(1984) , 10.1007/BF02403106
Noboru Fukuda, Takeshi Imura, Akio Hiraki, Takahisa Itahashi, Tomokazu Fukuda, Masayoshi Tanaka, Sensitive Detection of Hydrogen in a-Si: H by Coincidence Measurement of Elastically Scattered 100 MeV 3 He 2+ Ions and Recoil Protons Japanese Journal of Applied Physics. ,vol. 21, ,(1982) , 10.1143/JJAP.21.L532
Gérard Blandenet, Michel Court, Yves Lagarde, Thin layers deposited by the pyrosol process Thin Solid Films. ,vol. 77, pp. 81- 90 ,(1981) , 10.1016/0040-6090(81)90362-X
Hideyo Iida, Toshio Mishuku, Atsuo Ito, Koumei Kato, Mitsuyuki Yamanaka, Yutaka Hayashi, Sb-Doped SnO2 films deposited by the CMD (chemical mist deposition) method Solar Energy Materials. ,vol. 17, pp. 407- 423 ,(1988) , 10.1016/0165-1633(88)90001-9
K.L. Chopra, S. Major, D.K. Pandya, Transparent conductors—A status review Thin Solid Films. ,vol. 102, pp. 1- 46 ,(1983) , 10.1016/0040-6090(83)90256-0
Mamoru Mizuhashi, Yoshio Gotoh, Kunihiko Adachi, Texture Morphology of SnO2:F Films and Cell Reflectance Japanese Journal of Applied Physics. ,vol. 27, pp. 2053- 2061 ,(1988) , 10.1143/JJAP.27.2053