Fast scanning STED and two-photon fluorescence excitation microscopy with continuous wave beam

作者: P. BIANCHINI , A. DIASPRO

DOI: 10.1111/J.1365-2818.2011.03577.X

关键词: STED microscopyContinuous waveOpticsFluorescence microscopeConfocal4Pi microscopeLaser scanningMicroscopeMaterials scienceMicroscopy

摘要: In this paper we report stimulated emission depletion (STED) and two-photon excitation (2PE) fluorescence microscopy with continuous wave (CW) laser beam using a new generation scanning confocal microscope equipped for STED-CW (TCS STED-CW, Leica Microsystems, Mannheim, Germany). We show the possibility to achieve CW-2PE very same used STED-CW. This feature extends performance of allowing multimodal imaging (CW-2PE, confocal).

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