作者: P. BIANCHINI , A. DIASPRO
DOI: 10.1111/J.1365-2818.2011.03577.X
关键词: STED microscopy 、 Continuous wave 、 Optics 、 Fluorescence microscope 、 Confocal 、 4Pi microscope 、 Laser scanning 、 Microscope 、 Materials science 、 Microscopy
摘要: In this paper we report stimulated emission depletion (STED) and two-photon excitation (2PE) fluorescence microscopy with continuous wave (CW) laser beam using a new generation scanning confocal microscope equipped for STED-CW (TCS STED-CW, Leica Microsystems, Mannheim, Germany). We show the possibility to achieve CW-2PE very same used STED-CW. This feature extends performance of allowing multimodal imaging (CW-2PE, confocal).