Interfacial reactions between thin metal films and polar {0001} oriented CdS substrates: Part II Copper and gold films on CdS
作者： E. K. Chieh , Z. A. Munir
DOI: 10.1007/BF01142011
关键词: Polar 、 Thin metal 、 Materials science 、 Gold film 、 Chemical engineering 、 Copper
摘要:
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sci-hub.se 参考文章(10)
Peter J.K. Paterson, P.H. Holloway, Y.E. Strausser, Energy referencing of Auger electron spectra from charging samples by implanted inert gas spectra Applications of Surface Science. ,vol. 4, pp. 37- 50 ,(1980) , 10.1016/0378-5963(80)90005-7
C. F. Brucker, L. J. Brillson, Reactive interdiffusion at metal–CdS and metal–CdSe interfaces Journal of Vacuum Science and Technology. ,vol. 18, pp. 787- 791 ,(1981) , 10.1116/1.570948
L. J. Brillson, C. F. Brucker, N. G. Stoffel, A. D. Katnani, G. Margaritondo, Abruptness of Semiconductor-Metal Interfaces Physical Review Letters. ,vol. 46, pp. 838- 841 ,(1981) , 10.1103/PHYSREVLETT.46.838
Leonard J. Brillson, Chemical mechanisms of Schottky barrier formation Journal of Vacuum Science and Technology. ,vol. 16, pp. 1137- 1142 ,(1979) , 10.1116/1.570177
L. Braicovich, C. M. Garner, P. R. Skeath, C. Y. Su, P. W. Chye, I. Lindau, W. E. Spicer, Photoemission studies of the silicon-gold interface Physical Review B. ,vol. 20, pp. 5131- 5141 ,(1979) , 10.1103/PHYSREVB.20.5131
L. J. Brillson, C. F. Brucker, A. D. Katnani, N. G. Stoffel, G. Margaritondo, Chemical basis for InP‐metal Schottky‐barrier formation Applied Physics Letters. ,vol. 38, pp. 784- 786 ,(1981) , 10.1063/1.92162
L BRILLSON, The structure and properties of metal-semiconductor interfaces Surface Science Reports. ,vol. 2, pp. 123- 326 ,(1982) , 10.1016/0167-5729(82)90001-2
L. J. Brillson, Chemical reactions and local charge redistribution at metal-CdS and CdSe interfaces Physical Review B. ,vol. 18, pp. 2431- 2446 ,(1978) , 10.1103/PHYSREVB.18.2431
L. J. Brillson, Chemical reaction and charge redistribution at metal–semiconductor interfaces Journal of Vacuum Science and Technology. ,vol. 15, pp. 1378- 1383 ,(1978) , 10.1116/1.569792
C. F. Brucker, L. J. Brillson, Reactive interdiffusion and electronic barriers at metal–CdS and metal–CdSe interfaces: Control of Schottky barrier height using reactive interlayers Journal of Vacuum Science and Technology. ,vol. 19, pp. 617- 622 ,(1981) , 10.1116/1.571141