In situ high-temperature x-ray diffraction study on domain evolution in ferroelectric (Pb,La)TiO3 epitaxial thin films
作者： Young Min Kang , Sunggi Baik
DOI: 10.1063/1.366064
关键词: Materials science 、 Epitaxy 、 Lattice constant 、 Analytical chemistry 、 Crystallography 、 Ferroelectricity 、 Crystal 、 Perovskite (structure) 、 Nucleation 、 X-ray crystallography 、 Thin film
摘要: The cooling process encountered during fabrication of epitaxial Pb1−xLaxTiO3 (PLT, x=0.00–0.12) thin films prepared on MgO(001) single-crystal substrates is simulated using an x-ray high-temperature attachment, and diffraction measurements are performed at various temperatures, which a ferroelectric 90° domain structure has been evolved. lattice constants the degree c-axis orientation (α) PLT evaluated as function temperature below deposition (650 °C). 0.00 La-PLT film shows nucleation c domains TC, growth them expense c-domain dominant room temperature. By contrast, 0.12 abrupt evolution higher full width half-maximum 003 perovskite peak used to quantify crystal quality Considerable change i...
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