作者: S. P. Alpay , V. Nagarajan , L. A. Bendersky , M. D. Vaudin , S. Aggarwal
DOI: 10.1063/1.369670
关键词: Optics 、 Materials science 、 Pulsed laser deposition 、 Composite material 、 X-ray crystallography 、 Thin film 、 Electrode 、 Ferroelectricity 、 Transmission electron microscopy 、 Diffraction 、 Epitaxy
摘要: PbZr0.2Ti0.8O3(PZT) thin films with and without La0.5Sr0.5CoO3(LSCO) electrodes were grown epitaxially on (001) SrTiO3 at 650 °C by pulsed laser deposition. The domain structure of the 400 nm thick PZT different electrode layer configurations was investigated x-ray diffraction transmission electron microscopy. c-domain fractions no layer, a 50 between film substrate, layers top bottom found to be equal. Theoretical estimation fraction based minimization energy internal stresses in is good agreement experimental results. This means that depolarizing fields do not affect polydomain film. Calculations in-plane strains lattice parameters LSCO above led conclusion coherently strained match substrate.