作者: H.M. Fishmm , H.R. Leuchtag
DOI: 10.1016/S0070-2161(08)60227-0
关键词: Stochastic process 、 Characterization (materials science) 、 Shot noise 、 Thermal fluctuations 、 Fourier analysis 、 Noise (electronics) 、 Physics 、 Statistical physics 、 Thermal energy 、 Rectangular potential barrier
摘要: Publisher Summary In a circuit containing potential barrier such as rectifying junction in transistor, the current is limited to those electrons that have sufficient thermal energy surmount barrier. As result, fluctuates way determined by fluctuations position and distribution of electrons, producing type noise known shot noise. These similar problems are analyzed methods statistical physics. This chapter describes some these methods. It provides an overview formalisms which stochastic processes characterized reviews Fourier analysis applied problems. The also classical types observed electrical conduction. One types, fractal noise, involves nonequilibrium presently great interest because it has been shown encompass more traditional concept one-over-f techniques employed measurement described. concludes with discussion ion conductance biological membranes.