A novel method for accurately estimating alpha-induced soft error rates

作者: R. Takasu , Y. Tosaka , H. Fukuda , Y. Karaoka

DOI: 10.1109/RELPHY.2005.1493089

关键词: DosimetryNeutronParticle detectorEstimation theorySoft errorPhysicsParticle emissionElectronic engineeringAlpha (ethology)Computational physicsDetection limit

摘要: We have developed a sensitive dosimetry, vacuum /spl alpha/-tracking, and used it to measure dose rates of alpha/-particle emission in order estimate alpha/-induced soft error rates. found that the detection limit dosimetry is 3.2/spl times/10/sup -5/ alpha/ph/spl middot/cm/sup -2/, approximately 30 times more than conventional dosimetry. newly obtained LSI materials accelerated tests simulations demonstrate method provides drastically accurate rate estimation.

参考文章(9)
Y. Tosaka, S. Satoh, H. Oka, An Accurate and Comprehensive Soft Error Simulator NISES II Springer, Vienna. pp. 219- 222 ,(2004) , 10.1007/978-3-7091-0624-2_50
R.C. Baumann, E.B. Smith, Neutron-induced boron fission as a major source of soft errors in deep submicron SRAM devices international reliability physics symposium. pp. 152- 157 ,(2000) , 10.1109/RELPHY.2000.843906
Yoshiharu Tosaka, Hideo Ehara, Mitsuaki Igeta, Taiki Uemura, Hideki Oka, Nobuyuki Matsuoka, Kichiji Hatanaka, Comprehensive study of soft errors in advanced CMOS circuits with 90/130 nm technology international electron devices meeting. pp. 941- 944 ,(2004) , 10.1109/IEDM.2004.1419339
B.G. Cartwright, E.K. Shirk, P.B. Price, A nuclear-track-recording polymer of unique sensitivity and resolution Nuclear Instruments and Methods. ,vol. 153, pp. 457- 460 ,(1978) , 10.1016/0029-554X(78)90989-8
H. Kobayashi, K. Shiraishi, H. Tsuchiya, M. Motoyoshi, H. Usuki, Y. Nagai, K. Takahisa, T. Yoshiie, Y. Sakurai, T. Ishizaki, Soft errors in SRAM devices induced by high energy neutrons, thermal neutrons and alpha particles international electron devices meeting. pp. 337- 340 ,(2002) , 10.1109/IEDM.2002.1175847
Y. Tosaka, H. Kanata, T. Itakura, S. Satoh, Simulation technologies for cosmic ray neutron-induced soft errors: Models and simulation systems IEEE Transactions on Nuclear Science. ,vol. 46, pp. 774- 780 ,(1999) , 10.1109/23.774176
Y. Tosaka, S. Satoh, T. Itakura, Neutron-induced soft error simulator and its accurate predictions international conference on simulation of semiconductor processes and devices. pp. 253- 256 ,(1997) , 10.1109/SISPAD.1997.621385
B. D rschel, D. Hermsdorf, K. Kadner, H. K hne, Track Parameters and Etch Rates in Alpha-Irradiated CR-39 Detectors Used for Dosemeter Response Calculation Radiation Protection Dosimetry. ,vol. 78, pp. 205- 212 ,(1998) , 10.1093/OXFORDJOURNALS.RPD.A032353