Design and technology considerations for SiC bipolar devices: BJTs, IGBTs, and GTOs

作者: Qingchun Jon Zhang , Anant K. Agarwal

DOI: 10.1002/PSSA.200925103

关键词: Current injection techniqueGate turn-off thyristorPower electronicsSchottky diodeOptoelectronicsPower semiconductor deviceInsulated-gate bipolar transistorBipolar junction transistorTransistorMaterials science

摘要: … Figure 26 compares the carrier distribution profiles between IGBTs with and without CSL … is observed in IGBT with a CSL indicating injection enhancement. However, when CSL extends …

参考文章(40)
S.B. Bayne, C.W. Tipton, T.E. Griffin, C.J. Scozzie, B.R. Geil, High temperature inductive switching of SiC GTO and diode international power modulator symposium and high voltage workshop. pp. 207- 209 ,(2002) , 10.1109/MODSYM.2002.1189452
Santhosh Balachandran, TP Chow, A Agarwal, C Scozzie, KA Jones, 4kV 4H-SiC Epitaxial Emitter Bipolar Junction Transistors international symposium on power semiconductor devices and ic's. pp. 291- 294 ,(2005) , 10.1109/ISPSD.2005.1488008
Jian Hui Zhang, Petre Alexandrov, Jian Hui Zhao, 1600 V, 5.1 mΩ●cm2 4H-SiC BJT with a High Current Gain of β=70 Materials Science Forum. pp. 1155- 1158 ,(2008) , 10.4028/WWW.SCIENTIFIC.NET/MSF.600-603.1155
Michael E Levinshtein, Tigran T Mnatsakanov, Pavel A Ivanov, Anant K Agarwal, John W Palmour, Sergey L Rumyantsev, Aleksey G Tandoev, Sergey N Yurkov, Temperature dependence of turn-on processes in 4H–SiC thyristors Solid-state Electronics. ,vol. 45, pp. 453- 459 ,(2001) , 10.1016/S0038-1101(01)00039-9
Katsunori Danno, Daisuke Nakamura, Tsunenobu Kimoto, Investigation of carrier lifetime in 4H-SiC epilayers and lifetime control by electron irradiation Applied Physics Letters. ,vol. 90, pp. 202109- ,(2007) , 10.1063/1.2740580
Qing Chun Jon Zhang, Sei Hyung Ryu, Charlotte Jonas, Anant K Agarwal, John W Palmour, None, Simulations of 10 kV trench gate IGBTs on 4H-SiC Materials Science Forum. pp. 1405- 1408 ,(2006) , 10.4028/WWW.SCIENTIFIC.NET/MSF.527-529.1405
B. L. VanMil, R. E. Stahlbush, R. L. Myers-Ward, K.-K. Lew, C. R. Eddy, D. K. Gaskill, Basal plane dislocation reduction for 8° off-cut, 4H-SiC using in situ variable temperature growth interruptions Journal of Vacuum Science & Technology B. ,vol. 26, pp. 1504- 1507 ,(2008) , 10.1116/1.2918317
Charlotte Jonas, Craig Capell, Al Burk, Qingchun Zhang, Robert Callanan, Anant Agarwal, Bruce Geil, Charles Scozzie, 1200 V 4H-SiC Bipolar Junction Transistors with A Record β of 70 Journal of Electronic Materials. ,vol. 37, pp. 662- 665 ,(2008) , 10.1007/S11664-007-0331-1
J. Q. Liu, M. Skowronski, C. Hallin, R. Söderholm, H. Lendenmann, Structure of recombination-induced stacking faults in high-voltage SiC p–n junctions Applied Physics Letters. ,vol. 80, pp. 749- 751 ,(2002) , 10.1063/1.1446212
Qingchun Zhang, C. Jonas, M. O'Loughlin, R. Callanan, A. Agarwal, C. Scozzie, A 10-kV Monolithic Darlington Transistor With $\beta_{ \rm forced}$ of 336 in 4H-SiC IEEE Electron Device Letters. ,vol. 30, pp. 142- 144 ,(2009) , 10.1109/LED.2008.2009953