Raman characterization of Bi12SiO20 thin films obtained by pulsed laser deposition

作者: J.C. Alonso , R. Diamant , E. Haro-Poniatowski , M. Fernández-Guasti , G. Muñoz

DOI: 10.1016/S0169-4332(96)00674-5

关键词: Raman spectroscopyPulsed laser depositionOxygen deliveryOxygenSpectral lineThin filmAnalytical chemistryBismuthMaterials scienceCharacterization (materials science)

摘要: The synthesis by pulsed laser deposition and characterization Raman spectroscopy of Bi12SiO20 thin films are presented. spectra the close to their crystalline counterpart only in presence an oxygen flow during growth. In absence oxygen, observed similar that pure bismuth material.

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