Synthesis and microstructural characterization of Bi12SiO20 (BSO) thin films produced by the sol-gel process

作者: Asja Veber , Špela Kunej , Danilo Suvorov

DOI: 10.1016/J.CERAMINT.2009.07.024

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摘要: Abstract We have produced Bi 12 SiO 20 (BSO) thin films using the sol–gel process. The stable sol was synthesized Bi(NO 3 ) ·5H 2 O and Si(OC H 5 4 (TEOS) as precursors, acetic acid 2-ethoxyethanol solvents, ethanolamine stabilizer. stability of solution, which depends on concentration R h value (  = [H O]/[M]), directly affects microstructure BSO film. determined that optimal for preparation is 0.76 M. influences substrates, annealing temperature,  = value solution were investigated. X-ray diffraction (XRD) showed starts to form at 500 °C single-phase polycrystalline are formed 700 °C. coated characterized by means (XRD), scanning electron microscopy (SEM) atomic force (AFM).

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