Tip-related artifacts in scanning tunneling potentiometry
作者： J. P. Pelz , R. H. Koch
关键词: Surface finish 、 Scanning tunneling microscope 、 Quantum tunnelling 、 Thin film 、 Tunnel effect 、 Investigation methods 、 Analytical chemistry 、 Optics 、 Examination method 、 Materials science 、 Surface structure
摘要: Les artefacts lies a la pointe peuvent produire un comportement artificiellement brusque et/ou non monotone dans des mesures de potentiometrie effet tunnel balayage surfaces rugueuses. Ces fournir moyen detecter presence d'artefacts d'autres experiences microscopie balayage. Presentation quelques sur d'or ou AuPd
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sci-hub.se 参考文章(10)
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