作者: Yalin Lu , Jianjun Zheng , Mark Croning Golomb , Feiling Wang , Hua Jiang
DOI: 10.1063/1.124172
关键词: Thin film 、 Analytical chemistry 、 Epitaxy 、 Polarization (waves) 、 Ferroelectricity 、 Anisotropy 、 Materials science 、 Optoelectronics 、 Substrate (electronics) 、 Ellipsometry 、 Electric field
摘要: Strong electro-optical (EO) anisotropy has been measured in (1−x)Pb(Mg1/3Nb2/3)O3–xPbTiO3 [(1−x)PMN–xPT] single crystalline films epitaxially grown on (100)-cut LaAlO3 substrate, through using an improved dynamic alternating-current ellipsometric null EO detection technique with high accuracy. Large quadratic coefficients, which can be as large 1.38×10−16 (m/V)2 0.67PMN–0.33PT film, were obtained all the used compositions when electric field was applied along {110} directions. The strong explained according to structural relationship between ferroelectric polarization, input light and field.