作者: Oleg Tikhomirov , Hua Jiang , Jeremy Levy
DOI: 10.1063/1.1311950
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摘要: The temperature dependence of the local ferroelectric polarization BaxSr1−xTiO3 thin films is measured with submicrometer resolution using confocal scanning optical microscopy. hysteresis loop changes shape and disappears as increased over a narrow range temperatures (ΔT∼10 K). Curie TC(x,y) varies significantly position, distribution TC consistent broad dielectric permittivity through conventional methods. These results directly confirm hypothesis that phase transition in these materials inhomogeneously broadened.