Confocal scanning optical microscopy of BaxSr1−xTiO3 thin films
作者： Charles Hubert , Jeremy Levy , Adrian C. Carter , Wontae Chang , Steven W. Kiechoefer
DOI: 10.1063/1.120335
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摘要: An optical technique based on confocal scanning microscopy (CSOM) is used to image the ferroelectric polarization of BaxSr1−xTiO3 (BST) thin films at room temperature with submicron spatial resolution. BST were grown by pulsed laser deposition (100) SrTiO3 and MgO substrates 750 °C in 300 mTorr oxygen postdeposition annealed flowing temperatures ⩽1250 °C. Films both paraelectric (x=0.5) (x=0.8) compositions show a coexistence phases. The regions exhibit switching hysteresis relatively low (1–2 kV/cm) applied fields. These results suggest that nonuniform stress responsible for strong inhomogeneous thermal broadening phase transition, dielectric loss may be dominated small fraction nanometer-sized regions.
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