Measuring strain changes during production of thin film crystalline silicon on glass photovoltaic modules

作者: Ian Brazil , Martin A. Green

DOI: 10.1007/S10854-009-0048-4

关键词: Solar cellMaterials scienceThin filmComposite materialCrystallizationPhotovoltaic effectAnnealing (metallurgy)Borosilicate glassCrystalline siliconMineralogySilicon

摘要: We report on strain measurements made samples of thin-film crystalline silicon borosilicate glass solar cell obtained from CSG Solar after two significant thermal stages production. Samples were both solid phase crystallization and subsequent rapid annealing the silicon. Results indicate a large change in between stages. After polysilicon was found to be state high compressive residual with an average recorded value −0.24%. this film present almost entirely passivated, reducing by factor 4.7 record post −0.051%.

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