Semi-conductor component test procedure, as well as a data buffer component
作者： Thorsten Bucksch
DOI:
关键词: Relation (database) 、 Memory module 、 Data buffer 、 Data strobe encoding 、 Component (UML) 、 Buffer (optical fiber) 、 Process (computing) 、 Test procedures 、 Computer hardware 、 Computer science
摘要: The invention relates to a data buffer component, as well semi-conductor component test procedure for testing memory module with at least one connected in series before it, whereby the process includes modules by using indicator or strobe, signals, which have been chronologically advanced retarded pre-determined time period relation during normal operation.
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