Method and device for reading and for checking the time position of data response signals read out from a memory module to be tested
作者： Peter Pochmuller , Michael Schittenhelm , Jens Lupke , Gunnar Krause , Justus Kuhn
DOI:
关键词: Data strobe encoding 、 Computer hardware 、 Reading (computer) 、 Computer science 、 Clock signal 、 Real-time computing 、 Memory module 、 Measure (data warehouse) 、 Signal 、 Calibration 、 Position (vector)
摘要: A method and a device for reading checking the time position of data response read out from memory module to be tested, in particular DRAM operating DDR operation. In test receiver, tested is latched into latch with strobe signal that has been delayed. symmetrical clock generated as calibration signal. The used calibrate delayed respect response. latching delay programmed during operation also supplies measure testing precise relationships between (DQS)
lens.org 参考文章(8)
Igor Abrosimov, Alexander Deas, System for communicating with synchronous device ,(2001)
Katsuhisa Kubota, Test system for random access memory ,(1987)
Todd A. Merritt, Paul S. Zagar, Circuit and method for varying a period of an internal control signal during a test mode ,(1996)
Noriyuki Matsui, Memory testing method and apparatus, and computer-readable recording medium ,(1999)
Peter Pochmuller, Michael Schittenhelm, Jens Lupke, Gunnar Krause, Justus Kuhn, Wolfgang Ernst, Jochen Muller, System for testing fast integrated digital circuits, in particular semiconductor memory modules ,(2001)
Venkateswara Rao Madduri, Debug interface including data steering between a processor, an input/output port, and a trace logic ,(1998)
Peter Pochmuller, Michael Schittenhelm, Jens Lupke, Gunnar Krause, Justus Kuhn, Wolfgang Ernst, Jochen Muller, System for testing fast synchronous semiconductor circuits ,(2001)
James A. Gasbarro, Victor E. Lee, Lawrence Lai, Method and apparatus for testing memory ,(1999)