作者: Jiun-Li Lin , Po-Hsun Wu , Tsung-Yi Ho
DOI: 10.1109/ASPDAC.2013.6509644
关键词: Network synthesis filters 、 Electronic engineering 、 Thin-film transistor 、 Degradation (geology) 、 Chip 、 Materials science 、 Key (cryptography) 、 Flexible electronics 、 Work (thermodynamics) 、 Transistor 、 Algorithm
摘要: Mobility is the key device parameter to affect circuit performance in flexible thin-film transistor (TFT) technologies, and it very sensitive change of mechanical strain temperature. However, existing algorithms only consider impact cell placement TFT circuit. Without taking temperature into consideration, mobility may be dramatically decreased which leads degradation. This paper presents first work reduce influence caused by both Experimental results show that proposed can effectively chip variation.