作者: M. Bushnell , Vishwani Agrawal
DOI:
关键词: Test (assessment) 、 Outcome (game theory) 、 Semiconductor memory 、 Testability 、 Very-large-scale integration 、 Design for testing 、 Electronic circuit 、 Computer engineering 、 Computer science 、 Quality (business) 、 Reliability engineering
摘要: Today's electronic design and test engineers deal with several types of subsystems, namely, digital, memory, mixed-signal, each requiring different for testability methods. This book provides a careful selection essential topics on all three circuits. The outcome testing is product quality, which means "meeting the user's needs at minimum cost". includes economics techniques determining defect level VLSI chips. Besides being textbook course testing, it complete guide an engineer working any kind device or system system-on-a-chip.