作者: Kanchan Mondal , J. Manam
DOI: 10.1007/S10854-017-6606-2
关键词: Doping 、 Materials science 、 Scanning electron microscope 、 Dopant 、 Spectroscopy 、 Photoluminescence 、 Analytical chemistry 、 Field electron emission 、 Band gap 、 Phosphor
摘要: The Sm3+ doped Sr2MgSi2O7 phosphors were prepared via solid state reaction method. have characterised with X-ray diffraction (XRD), Field emission electron scanning microscope (FESEM), Diffuse reflectance (DR) spectroscopy, Photoluminescence (PL) together decay curve. XRD pattern shows the phase purity of phosphors. In FESEM study particle spherical morphology and consists particles irregular different size distribution. band gaps samples found to be increased trend corresponding increase dopant concentration. strongest excitation peaks observed at 402 nm (6H5/2→4F7/2) 603 (4G5/2→6H7/2) respectively. yellowish color wavelength nm. phosphor excellent thermal stability. critical concentration ions in lattice was 3 mol%. energy transfer distance (Rc) sample 17.36 A. quenching procedure for transition 4G5/2→6H7/2 multipole–multipole interaction.