Anodic film formation on sputter-deposited amorphous Al-Zr alloys
作者： H Habazaki , P Skeldon , K Shimizu , G E Thompson , G C Wood
DOI: 10.1088/0022-3727/28/12/033
关键词: Metallurgy 、 Boron 、 Amorphous solid 、 Alloy 、 Electrolyte 、 Chemical engineering 、 Cubic zirconia 、 Materials science 、 Zirconium 、 Sputtering 、 Aluminium
摘要: The anodic oxidation of amorphous Al-32 at% Zr alloy films at high current efficiency results in films, comprising a mixture Al2O3 and ZrO2 units, uniform composition thickness. use an immobile xenon marker reveals that the develop, under field, alloy/film film/electrolyte interfaces by inward transport O2- OH- ions outward cations respectively. This mechanism is typical growth involving cooperative anions. total number about 0.35. Zirconium aluminium are incorporated into their proportions, without development significant enrichments or depletions zirconium interface. Zr4+ ions, Which usual crystalline zirconia, migrate outwards same rate as Al3+ ions. Boron species, from electrolyte, distributed uniformly film material formed interface migration cations.
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