Microtexture determination by electron back-scatter diffraction

作者: D. J. Dingley , V. Randle

DOI: 10.1007/BF01165988

关键词: Texture (geology)Electron diffractionBackscatter X-rayOpticsElectron backscatter diffractionDiffractionOrientation (computer vision)Materials scienceGrain boundaryGrain size

摘要: This review describes the use of an experimental technique known as electron back-scatter diffraction (EBSD) to measure microtexture, that is, spatially specific texture measured on individual orientation basis. Other methods microtexture determination are briefly described and compared with EBSD. The EBSD itself is in considerable detail including recent developments such on-line automation. Those EBSD-based studies which have been reported literature summarized, those provide a direct comparison macrotexture measurements obtained by X-ray diffraction. concept grains leads naturally idea “mesotexture” grain boundaries. Mesotexture data can be computed from EBSD-generated this demonstrated examples given. Examples microtexture/mesotexture multiphase materials also shown. Finally, because allows simultaneous microstructural information, it pertinent discuss ways displaying sort data, so completed discussion representation microtextures mesotextures, Rodrigues-Frank space mapping.

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