Investigation on synchronization of the offset printing process for fine patterning and precision overlay
作者： Dongwoo Kang , Eonseok Lee , Hyunchang Kim , Young-Man Choi , Seunghyun Lee
DOI: 10.1063/1.4882020
关键词: Offset printing 、 Printed electronics 、 Process (computing) 、 Synchronization 、 Slip (materials science) 、 Overlay 、 Ripple 、 Computer science 、 Printing registration 、 Control theory
摘要: Offset printing processes are promising candidates for producing printed electronics due to their capacity for fine patterning and suitability for mass production. To print high-resolution …
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