作者: I.A. Rauf , L.M. Brown
DOI: 10.1016/0956-7151(94)90048-5
关键词: Nucleation 、 Chemical engineering 、 Indium 、 Oxide 、 Transmission electron microscopy 、 Crystallization 、 Crystallography 、 Irradiation 、 Thin film 、 Amorphous solid 、 Materials science 、 General Engineering
摘要: Abstract We have studied reactively evaporated thin films of amorphous indium oxide by HREM and attempted to observe the structural changes appearing during course crystallization as are irradiated with electron beam. Two kinds process observed for crystallization: (i) gradual ordering over whole projected area leading no obvious nucleation event, (ii) growth process.