Corrosion Effects on Reliability of Flat Plates in Tension

作者: Weiwei Yu , Dale G. Karr , Pedro M. Vargas

DOI: 10.1115/1.4004520

关键词: Reliability (semiconductor)Stress (mechanics)CorrosionComposite materialStress concentrationEngineeringStructural engineeringTension (physics)

摘要:

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