3D non-volatile memory array with sub-block erase architecture

作者: Teng-Hao Yeh , Kuo-Pin Chang

DOI:

关键词: NAND gateBlock (programming)Computer scienceReference lineParallel computingControl circuitSet (abstract data type)Line (text file)Non-volatile memoryComputer hardware

摘要: A memory device has a divided reference line structure which supports sub-block erase in NAND including plurality of blocks. Each block the blocks is coupled to set Y lines, where two or more. includes single select (RSL), operable connect each corresponding lines. control circuit can be included on configured for an operation selected block.