作者: Ron Jenkins
DOI:
关键词: Physics 、 X-ray fluorescence 、 Reflection (mathematics) 、 Synchrotron 、 Wavelength 、 Instrumentation 、 Optics 、 Photoelectric effect 、 Analytical chemistry 、 X ray photons 、 Mass spectrometry
摘要: The article contains sections titled: 1. Introduction 1.1. Properties of X-Rays 1.2. Scattering and Diffraction 1.3. Absorption X-Rays 1.4. X-ray Fluorescence 2. Historical Development X-ray Spectrometry 3. Relationship Between Wavelength Atomic Number 3.1. Characteristic Radiation 3.2. Selection Rules 3.3. Nomenclature for Wavelengths 4. Instrumentation 4.1. Sources 4.2. Detectors 4.3. Types Spectrometer 4.4. Wavelength Dispersive Systems 4.5. Energy Systems 5. Accuracy 5.1. Counting Statistical Errors 5.2. Matrix Effects 6. Quantitative Analysis 6.1. Internal Standards 6.2. Type Standardization 6.3. Influence Correction Methods 6.4. Fundamental Methods 7. Trace Analysis 7.1. Analysis Low Concentrations 7.2. Analysis Small Amounts Sample 8. New developments in Instrumentation Techniques 8.1. Total Reflection Spectrometry 8.2. Spectrometers with Capillary Optics 8.3. Applications the Synchrotron