X-ray fluorescence spectrometry

作者: Ron Jenkins

DOI:

关键词: PhysicsX-ray fluorescenceReflection (mathematics)SynchrotronWavelengthInstrumentationOpticsPhotoelectric effectAnalytical chemistryX ray photonsMass spectrometry

摘要: The article contains sections titled: 1. Introduction 1.1. Properties of X-Rays 1.2. Scattering and Diffraction 1.3. Absorption X-Rays 1.4. X-ray Fluorescence 2. Historical Development X-ray Spectrometry 3. Relationship Between Wavelength Atomic Number 3.1. Characteristic Radiation 3.2. Selection Rules 3.3. Nomenclature for Wavelengths 4. Instrumentation 4.1. Sources 4.2. Detectors 4.3. Types Spectrometer 4.4. Wavelength Dispersive Systems 4.5. Energy Systems 5. Accuracy 5.1. Counting Statistical Errors 5.2. Matrix Effects 6. Quantitative Analysis 6.1. Internal Standards 6.2. Type Standardization 6.3. Influence Correction Methods 6.4. Fundamental Methods 7. Trace Analysis 7.1. Analysis Low Concentrations 7.2. Analysis Small Amounts Sample 8. New developments in Instrumentation Techniques 8.1. Total Reflection Spectrometry 8.2. Spectrometers with Capillary Optics 8.3. Applications the Synchrotron

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