Direct observation of electron dephasing due to inelastic scattering from defects in weakly disordered AuPd wires.

摘要: To identify and investigate the mechanisms of electron-phonon ($e\mathrm{\text{\ensuremath{-}}}\mathrm{ph}$) relaxation in weakly disordered metallic conductors, we measure electron dephasing rate a series suspended supported 15-nm thick AuPd wires. In wide temperature range, from $\ensuremath{\sim}8\text{ }\text{ }\mathrm{K}$ to above 20 K, $e\mathrm{\text{\ensuremath{-}}}\mathrm{ph}$ interaction dominates processes. The corresponding reveals quadratic dependence, ${\ensuremath{\tau}}_{e\mathrm{\text{\ensuremath{-}}}\mathrm{ph}}^{\ensuremath{-}1}={A}_{ep}{T}^{2}$, where ${A}_{ep}\ensuremath{\approx}5\ifmmode\times\else\texttimes\fi{}{10}^{9}\text{ }{\mathrm{K}}^{\ensuremath{-}2}\text{ }{\mathrm{s}}^{\ensuremath{-}1}$ is essentially same for all samples studied. Our observations are shown be good agreement with theory which predicts that, even structures at moderately low temperatures, major mechanism scattering vibrating defects impurities.