Testing system for reliable access times in ROM semiconductor memories
作者： Robert D. Catiller
DOI:
关键词: Registered memory 、 Semiconductor memory 、 Flat memory model 、 Computer hardware 、 Computer memory 、 Electronic engineering 、 Computer science 、 Memory refresh 、 Sense amplifier 、 Auxiliary memory 、 Interleaved memory
摘要: A testing circuit is disclosed for addressing and exercising a ROM-type memory splitting the same output data into two paths. One path used to temporarily hold time-interval after which it compared, in digital comparator, with on second path. When both paths compare equally, then known that no instability has occurred during time-interval. If miscompare occurs, comparator generates an error signal.
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